ACTS08D Ver la hoja de datos (PDF) - Intersil
Número de pieza
componentes Descripción
Fabricante
ACTS08D Datasheet PDF : 8 Pages
| |||
Specifications ACTS08MS
TABLE 5. DELTA PARAMETERS (+25oC)
PARAMETER
SYMBOL
(NOTE 1)
DELTA LIMIT
Supply Current
ICC
±1.0
Output Current
IOL/IOH
±15
NOTE:
1. All delta calculations are referenced to 0 hour readings or pre-life readings.
UNITS
µA
%
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
METHOD
GROUP A SUBGROUPS
Initial Test (Preburn-In)
100%/5004
1, 7, 9
Interim Test 1 (Postburn-In)
100%/5004
1, 7, 9
Interim Test 2 (Postburn-In)
100%/5004
1, 7, 9
PDA
100%/5004
1, 7, 9, Deltas
Interim Test 3 (Postburn-In)
100%/5004
1, 7, 9
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005 1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTE:
1. Alternate Group A testing may be exercised in accordance with MIL-STD-883, Method 5005.
READ AND RECORD
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
Subgroups 1, 2, 3, 9, 10, 11
TABLE 7. TOTAL DOSE IRRADIATION
TEST
CONFORMANCE GROUP METHOD
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
NOTE:
1. Except FN test which will be performed 100% Go/No-Go.
READ AND RECORD
PRE RAD
POST RAD
1, 9
Table 4 (Note 1)
TABLE 8. BURN-IN TEST CONNECTIONS (+125oC < TA < 139oC)
OSCILLATOR
OPEN
GROUND
1/2 VCC = 3V ±0.5V
VCC = 6V ±0.5V
50kHz
25kHz
STATIC BURN-IN I (Note 1)
-
1, 2, 4, 5, 7, 9, 10,
3, 6, 8, 11
14
12, 13
-
-
STATIC BURN-IN II (Note 1)
-
7
3, 6, 8, 11
1, 2, 4, 5, 9, 10, 12, 13, 14
-
-
DYNAMIC BURN-IN TEST CONNECTIONS (Note 1)
-
7
3, 6, 8, 11
14
1, 2, 4, 5, 9, 10, 12, 13
-
NOTE:
1. Each pin except VCC and GND will have a series resistor of 500Ω ±5%.
TABLE 9. IRRADIATION TEST CONNECTIONS (TA = +25oC, ±5oC)
FUNCTION
OPEN
GROUND
VCC = 5V ±0.5V
Irradiation Circuit (Note 1)
3, 6, 8, 11
7
1, 2, 4, 5, 9, 10, 11, 12, 13, 14
NOTE:
1. Each pin except VCC and GND will have a series resistor of 47kΩ ±5%. Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures.
Spec Number 518851
4
Share Link: 