7WBD3305(2014) Ver la hoja de datos (PDF) - ON Semiconductor
Número de pieza
componentes Descripción
Fabricante
7WBD3305 Datasheet PDF : 12 Pages
| |||
7WBD3305
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
VIN
VI/O
IIK
IOK
IO
ICC
IGND
TSTG
TL
TJ
qJA
DC Supply Voltage
Control Pin Input Voltage
Switch Input / Output Voltage
Control Pin DC Input Diode Current
Switch I/O Port DC Diode Current
ON−State Switch Current
Continuous Current Through VCC or GND
DC Supply Current Per Supply Pin
DC Ground Current per Ground Pin
Storage Temperature Range
Lead Temperature, 1 mm from Case for 10 Seconds
Junction Temperature Under Bias
Thermal Resistance
VIN < GND
VI/O < GND
US8 (Note 1)
UDFN8
UQFN8
Micro8
−0.5 to +7.0
−0.5 to +7.0
−0.5 to +7.0
−50
−50
$128
$150
$150
$150
−65 to +150
260
150
251
111
208
392
V
V
V
mA
mA
mA
mA
mA
mA
°C
°C
°C
°C/W
PD
Power Dissipation in Still Air at 85°C
US8
498
mW
UDFN8
1127
UQFN8
601
Micro8
319
MSL
Moisture Sensitivity
Level 1
FR
Flammability Rating Oxygen Index: 28 to 34
UL 94 V−0 @ 0.125 in
VESD
ESD Withstand Voltage
Human Body Mode (Note 2)
> 2000
V
Machine Model (Note 3)
> 200
Charged Device Model (Note 4)
N/A
ILATCHUP
Latchup Performance Above VCC and Below GND at 125°C (Note 5)
$200
mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2 ounce copper trace no air flow.
2. Tested to EIA / JESD22−A114−A.
3. Tested to EIA / JESD22−A115−A.
4. Tested to JESD22−C101−A.
5. Tested to EIA / JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Max
Unit
VCC
VIN
VI/O
TA
Dt/DV
Positive DC Supply Voltage
Control Pin Input Voltage
Switch Input / Output Voltage
Operating Free−Air Temperature
Input Transition Rise or Fall Rate
Control Input
Switch I/O
4.0
5.5
V
0
5.5
V
0
5.5
V
−55
+125
°C
0
5
nS/V
0
DC
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
http://onsemi.com
3
Share Link: 