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VSC6250QW
Vitesse
Vitesse Semiconductor Vitesse
VSC6250QW Datasheet PDF : 18 Pages
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Data Sheet
VSC6250
VITESSE
SEMICONDUCTOR CORPORATION
1Gb/s 16-Channel
Drive-Side Deskew IC
Functional Description
The VSC6250 is a 1Gb/s 16-channel drive-path deskew IC designed for deskewing differences in path
delay between multiple DUTs in a high-speed memory test system. The VSC6250 can be used as two indepen-
dent 1:8 fanout and deskew sections or as a single 1:16 fanout and deskew. When used as two 1:8 deskews,
input signals are applied to inputs DINA and DINB. When used as a single 1:16 deskew, the input is applied to
input DIN.
The VSC6250 is designed to operate with a conventional 500MHz timing generator which outputs format-
ted pulses to the VSC6250 deskew IC. See Figure 1. The waveform at the input of the VSC6250 is the same as
that presented to the DUT pin. In a memory tester, such a 500MHz timing generator IC may be designed:
• Using one edge to output a single 500Mb/s data stream
• Using two edges to output a single 500Mb/s data stream preceded its complement
• Using three edges to output a single data stream at 500Mb/s surrounded by its complement
• Using two edges to output two interleaved 500Mb/s data streams for an aggregate bandwidth of 1Gb/s.
Formatting is performed inside the timing generator IC. An example interface between the timing generator
IC and the deskew is shown in Figure 1. This configuration is capable of supporting the four different data out-
put choices, with appropriate design of the formatting logic.
The VSC6250 can handle pulses with a data rate up to 1Gb/s or a pulse repetition rate up to 2ns. A timing
diagram for the VSC6250 is shown in Figure 2.
Figure 1: VSC6250 Interface to Timing Generator IC
Timing Generator
VSC6250
Timeset/Dataset
RAM
S
R
Format
S
Logic
R
S
R
DINx
DOUTx
Figure 2: VSC6250 AC Timing Diagram
tREFIRE
tPWI
tPWO
tPDR
tPDF
G52197-0, Rev. 4.0
© VITESSE SEMICONDUCTOR CORPORATION
8/19/00
741 Calle Plano, Camarillo, CA 93012 • 805/388-3700 • FAX: 805/987-5896
Page 3

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