E
28F016XS FLASH MEMORY
5.4 DC Characteristics (Continued)
VCC = 3.3V ± 5%, TA = 0°C to +70°C
3/5# = Pin Set High for 3.3V Operations
Symbol
Parameter
Notes Min Typ Max Units
Test Conditions
VPPLK
VPP
Erase/Program
Lock Voltage
3,6 0.0
1.5
V
VPPH1
VPP during
Program/Erase
Operations
3
4.5 5.0 5.5
V
VPPH2
VPP during
Program/Erase
Operations
3
11.4 12.0 12.6 V
VLKO
VCC
2.0
V
Erase/Program
Lock Voltage
NOTES:
1. All currents are in RMS unless otherwise noted. Typical values at VCC = 3.3V, VPP = 12.0V or 5.0V, T = +25°C. These
currents are valid for all product versions (package and speeds).
2. ICCES is specified with the device de-selected. If the device is read while in erase suspend mode, current draw is the sum of
ICCES and ICCR.
3. Block erases, programs and lock block operations are inhibited when VPP ≤ VPPLK and not guaranteed in the ranges
between VPPLK(max) and VPPH1(min), between VPPH1 (max) and VPPH2(min) and above VPPH2(max).
4. Automatic Power Savings (APS) reduces ICCR to 3 mA typical in static operation.
5. CMOS Inputs are either VCC ± 0.2V or GND ± 0.2V. TTL Inputs are either VIL or VIH.
6. Sampled, but not 100% tested. Guaranteed by design.
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