28F016XS-20 Ver la hoja de datos (PDF) - Intel

Número de pieza

componentes Descripción

Fabricante

28F016XS-20

16-MBIT (1 MBIT x 16, 2 MBIT x 8) SYNCHRONOUS FLASH MEMORY

Intel 

28F016XS FLASH MEMORY

5.3 Transient Input/Output Reference Waveforms

E

2.4

2.0

INPUT

TEST POINTS

0.8

0.45

2.0

OUTPUT

0.8

0532_07

AC test inputs are driven at VOH (2.4 VTTL) for a Logic “1” and VOL (0.45 VTTL) for a Logic “0.” Input timing begins at VIH

(2.0 VTTL) and VIL (0.8 VTTL). Output timing ends at VIH and VIL. Input rise and fall times (10% to 90%) <10 ns.

Figure 8. Transient Input/Output Reference Waveform (VCC = 5.0V ± 5%)

for Standard Testing Configuration(1)

3.0

INPUT

1.5

TEST POINTS

1.5 OUTPUT

0.0

0532_08

AC test inputs are driven at 3.0V for a Logic “1” and 0.0V for a Logic “0.” Input timing begins, and output timing ends, at 1.5V.

Input rise and fall times (10% to 90%) <10 ns.

Figure 9. Transient Input/Output Reference Waveform (VCC = 3.3V ± 5%)

High Speed Reference Waveform(2) (VCC = 5.0V ± 5%)

NOTES:

1. Testing characteristics for 28F016XS-20 at 5V VCC.

2. Testing characteristics for 28F016XS-15 at 5V VCC and 28F016XS-20/28F016XS-25 at 3.3V VCC.

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