AD7846(RevE) Ver la hoja de datos (PDF) - Analog Devices
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AD7846 Datasheet PDF : 16 Pages
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AD7846
ABSOLUTE MAXIMUM RATINGS1
VDD to DGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.4 V to +17 V
VCC to DGND . . . . . . . . . . . . . . . –0.4 V, VDD + 0.4 V or +7 V
(Whichever Is Lower)
VSS to DGND . . . . . . . . . . . . . . . . . . . . . . . . . +0.4 V to –17 V
VREF+ to DGND . . . . . . . . . . . . . . . . VDD + 0.4 V, VSS – 0.4 V
VREF– to DGND . . . . . . . . . . . . . . . . VDD + 0.4 V, VSS – 0.4 V
VOUT to DGND2 . . . . . . . . VDD + 0.4 V, VSS – 0.4 V or ± 10 V
(Whichever Is Lower)
RIN to DGND . . . . . . . . . . . . . . . . . . VDD + 0.4 V, VSS – 0.4 V
Digital Input Voltage to DGND . . . . . . –0.4 V to VCC + 0.4 V
Digital Output Voltage to DGND . . . . . –0.4 V to VCC + 0.4 V
Power Dissipation (Any Package)
To +75°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1000 mW
Derates above +75°C . . . . . . . . . . . . . . . . . . . . . 10 mW/°C
Operating Temperature Range
J, K Versions . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to +70°C
A, B Versions . . . . . . . . . . . . . . . . . . . . . . . –25°C to +85°C
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering) . . . . . . . . . . . . . . . . . . +300°C
NOTES
1Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability. Only one Absolute
Maximum Rating may be applied at any one time.
2VOUT may be shorted to DGND, VDD, VSS, VCC provided that the power dissipation
of the package is not exceeded.
Model
AD7846JN
AD7846KN
AD7846JP
AD7846KP
AD7846AP
AD7846AQ
AD7846BP
Temperature Range
0°C to +70°C
0°C to +70°C
0°C to +70°C
0°C to +70°C
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
ORDERING GUIDE
Relative Accuracy
± 16 LSB
± 8 LSB
± 16 LSB
± 8 LSB
± 16 LSB
± 16 LSB
± 8 LSB
Package Description
Plastic DIP
Plastic DIP
Plastic Leaded Chip Carrier (PLCC)
Plastic Leaded Chip Carrier (PLCC)
Plastic Leaded Chip Carrier (PLCC)
Ceramic DIP
Plastic Leaded Chip Carrier (PLCC)
Package Options
N-28A
N-28A
P-28A
P-28A
P-28A
Q-28
P-28A
CAUTION
ESD (electrostatic discharge) sensitive device. The digital control inputs are diode protected;
however, permanent damage may occur on unconnected devices subject to high energy electro-
static fields. Unused devices must be stored in conductive foam or shunts. The protective foam
should be discharged to the destination socket before devices are removed.
WARNING!
ESD SENSITIVE DEVICE
TERMINOLOGY
LEAST SIGNIFICANT BIT
This is the analog weighting of 1 bit of the digital word in a DAC.
For the AD7846, 1 LSB = (VREF+ – VREF–)/216.
Relative Accuracy
Relative accuracy or endpoint nonlinearity is a measure of the
maximum deviation from a straight line passing through the end-
points of the DAC transfer function. It is measured after adjust-
ing for both endpoints (i.e., offset and gain errors are adjusted
out) and is normally expressed in least significant bits or as a
percentage of full-scale range.
Differential Nonlinearity
Differential nonlinearity is the difference between the measured
change and the ideal change between any two adjacent codes. A
specified differential nonlinearity of ± 1 LSB over the operating
temperature range ensures monotonicity.
Gain Error
Gain error is a measure of the output error between an ideal
DAC and the actual device output with all 1s loaded after offset
error has been adjusted out. Gain error is adjustable to zero
with an external potentiometer.
Offset Error
This is the error present at the device output with all 0s loaded
in the DAC. It is due to op amp input offset voltage and bias
current and the DAC leakage current.
Bipolar Zero Error
When the AD7846 is connected for bipolar output and 10 . . . 000
is loaded to the DAC, the deviation of the analog output from the
ideal midscale of 0 V is called the bipolar zero error.
Digital-to-Analog Glitch Impulse
This is the amount of charge injected from the digital inputs to
the analog output when the inputs change state. This is normally
specified as the area of the glitch in either pA-secs or nV-secs
depending upon whether the glitch is measured as a current or a
voltage.
Multiplying Feedthrough Error
This is an ac error due to capacitive feedthrough from either of
the VREF terminals to VOUT when the DAC is loaded with all 0s.
Digital Feedthrough
When the DAC is not selected (i.e., CS is held high), high fre-
quency logic activity on the digital inputs is capacitively coupled
through the device to show up as noise on the VOUT pin. This
noise is digital feedthrough.
–4–
REV. E
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