74VHC573 Ver la hoja de datos (PDF) - ON Semiconductor

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Fabricante

74VHC573

Octal D−Type Latch with 3−State Output

ON Semiconductor 

DEVICE

UNDER

TEST

TEST POINT

OUTPUT

CL*

*Includes all probe and jig capacitance

Figure 5.

MC74VHC573

TEST CIRCUITS

DEVICE

UNDER

TEST

TEST POINT

OUTPUT

1 kΩ

CL*

CONNECT TO VCC WHEN

TESTING tPLZ AND tPZL.

CONNECT TO GND WHEN

TESTING tPHZ AND tPZH.

*Includes all probe and jig capacitance

Figure 6.

D0 2

D1 3

D2 4

D3 5

D4 6

D5 7

D6 8

D7 9

EXPANDED LOGIC DIAGRAM

D

Q

LE

D

Q

LE

DQ

LE

DQ

LE

DQ

LE

D

Q

LE

D

Q

LE

D

Q

LE

19 Q0

18 Q1

17 Q2

16 Q3

15 Q4

14 Q5

13 Q6

12 Q7

LE 11

OE 1

INPUT

Figure 7. Input Equivalent Circuit

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