GS78116B Ver la hoja de datos (PDF) - Giga Semiconductor
Número de pieza
componentes Descripción
Fabricante
GS78116B Datasheet PDF : 11 Pages
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AC Test Conditions
Parameter
Conditions
Input high level
Input low level
Input rise time
VIH = 2.4 V
VIL = 0.4 V
tr = 1 V/ns
Input fall time
tf = 1 V/ns
Input reference level
1.4 V
Output reference level
1.4 V
Output load
Fig. 1& 2
Notes:
1. Include scope and jig capacitance.
2. Test conditions as specified with output loading as shown in Fig. 1
unless otherwise noted
3. Output load 2 for tLZ, tHZ, tOLZ and tOHZ.
GS78116B
Output Load 1
DQ
50Ω 30pF1
VT = 1.4 V
Output Load 2
3.3 V
DQ
589Ω
5pF1 434Ω
AC Characteristics
Read Cycle
Parameter
Read cycle time
Address access time
Chip enable access time (CE)
Output enable to output valid (OE)
Output hold from address change
Chip enable to output in low Z (CE)
Output enable to output in low Z (OE)
Chip disable to output in High Z (CE)
Output disable to output in High Z (OE)
-10
-12
-15
Symbol
Unit
Min Max Min Max Min Max
tRC
10 — 12 — 15 — ns
tAA
— 10 — 12 — 15 ns
tAC
— 10 — 12 — 15 ns
tOE
—
4
—
5
—
6
ns
tOH
3
—
3
—
3
—
ns
tLZ*
3
—
3
—
3
—
ns
tOLZ*
0
—
0
—
0
—
ns
tHZ*
—
5
—
6
—
7
ns
tOHZ*
—
4
—
5
—
6
ns
Rev: 1.02 9/2001
5/11
For latest documentation see http://www.gsitechnology.com.
© 1999, Giga Semiconductor, Inc.
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