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H27UAG8T2B Ver la hoja de datos (PDF) - Hynix Semiconductor

Número de pieza
componentes Descripción
Fabricante
H27UAG8T2B
Hynix
Hynix Semiconductor Hynix
H27UAG8T2B Datasheet PDF : 61 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
Multilevel Cell technology
Supply Voltage
- 3.3V device : Vcc = 2.7 V ~ 3.6 V
Vcc = 2.7 V ~ 3.6 V
Organization
- Page size : 8,640 Bytes(8,192+448 bytes)
- Block size : 256 pages(2M+112K bytes)
- Plane size : 512 blocks
Page Read Time
- Random Access: 200 (Max.)
- Sequential Access : 25 (Min.)
Write Time
- Page program : 1600 (Typ.)
- Block erase : 2.5 (Typ.)
Operating Current
- Read
- Program
- Erase
- Standby
Hardware Data Protection
- Program/Erase locked during power transitions
Release
H27UAG8T2B Series
16Gb (2048M x 8bit) NAND Flash
Endurance
- 3,000 P/E cycles (with 24 bit/ 1,024byte ECC)
Data Retention
- 10 Years
Package
- TSOP (12x20), 48Pin
- Wafer (Bare Die)
Unique ID for copyright protection
1. SUMMARY DESCRIPTION
Rev 1.0 / Aug. 2010
3

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