CXK5V81000ATM Ver la hoja de datos (PDF) - Sony Semiconductor

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componentes Descripción

Fabricante

CXK5V81000ATM

131072-word × 8-bit High Speed CMOS Static RAM

Sony Semiconductor 

I/O capacitance

Item

Symbol Test conditons Min.

Input capacitance

CIN

VIN = 0V

—

I/O capacitance

CI/O

VI/O = 0V

—

Note) This parameter is sampled and is not 100% tested.

(Ta = 25°C, f = 1MHz)

Typ. Max. Unit

—

8 pF

—

10 pF

CXK5V81000ATM

AC Characteristics

• AC test conditions (VCC = 3.3V ± 0.3V, Ta = –25 to +85°C)

Item

Input pulse high level

Input pulse low level

Input rise time

Input fall time

Conditions

VIH = 2.2V

VIL = 0.6V

tr = 5ns

tf = 5ns

Input and output reference level

Output load conditions

-85LLX

-10LLX

1.4V

CL∗ = 30pF, 1TTL

CL∗ = 100pF, 1TTL

∗ CL includes scope and jig capacitances.

• Test circuit

TTL

CL

–4–

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