AM27C010-120JC Ver la hoja de datos (PDF) - Advanced Micro Devices

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Fabricante

AM27C010-120JC

1 Megabit (128 K x 8-Bit) CMOS EPROM

Advanced Micro Devices 

SWITCHING TEST CIRCUIT

Device

Under

Test

CL

5.0 V

IN3064

or Equivalent 2.7 kΩ

6.2 kΩ

Diodes = IN3064

or Equivalent

Notes:

For -45 and -55: CL = 30 pF including jig capacitance

For all others: CL = 100 pF including jig capacitance

Figure 1. Test Conditions

10205F-8

SWITCHING TEST WAVEFORM

3V

1.5 V

0V

Input

Test Points

1.5 V

Output

2.4 V

0.45 V

2.0 V

2.0 V

Test Points

0.8 V

0.8 V

Input

Output

AC Testing for -45 and -55 devices: Inputs are driven at 3.0 V

for a logic “1” and 0 V for a logic “0”. Input pulse rise and fall

times are ≤20 ns.

AC Testing (except for -45 and -55 devices): Inputs are driven

at 2.4 V for a logic “1” and 0.45 V for a logic “0”. Input pulse

rise and fall times are ≤20 ns.

10205F-9

Am27C010

11

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