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28C64A-15

64K (8K x 8) CMOS EEPROM

Microchip Technology 

28C64A

TABLE 1-4: BYTE WRITE AC CHARACTERISTICS

AC Testing Waveform:

Output Load:

Input Rise/Fall Times:

Ambient Temperature:

VIH = 2.4V; VIL = 0.45V; VOH = 2.0V; VOL = 0.8V

1 TTL Load + 100 pF

20 ns

Commercial (C): Tamb = 0˚C to +70˚C

Industrial (I): Tamb = -40˚C to +85˚C

Parameter

Symbol

Min

Max

Units

Remarks

Address Set-Up Time

tAS

10

—

ns

Address Hold Time

tAH

50

—

ns

Data Set-Up Time

tDS

50

—

ns

Data Hold Time

tDH

10

—

ns

Write Pulse Width

tWPL

100

—

ns Note 1

Write Pulse High Time

tWPH

50

—

ns

OE Hold Time

tOEH

10

—

ns

OE Set-Up Time

tOES

10

—

ns

Data Valid Time

tDV

—

1000

ns Note 2

Time to Device Busy

tDB

2

50

ns

Write Cycle Time (28C64A)

tWC

—

1

ms 0.5 ms typical

Write Cycle Time (28C64AF)

tWC

—

200

µs 100 µs typical

Note 1: A write cycle can be initiated be CE or WE going low, whichever occurs last. The data is latched on the pos-

itive edge WE, whichever occurs first.

2: Data must be valid within 1000ns max. after a write cycle is initiated and must be stable at least until tDH after

the positive edge of WE or CE, whichever occurs first.

FIGURE 1-2: PROGRAMMING WAVEFORMS

VIH

Address

VIL

VIH

CE, WE

VIL

VIH

Data In

VIL

VIH

OE

VIL

VOH

Rdy/Busy

VOL

t AS

t AH

t WPL

t DV

t DS

t OES

t WC

t DH

t OEH

t DB

Busy

Ready

DS11109H-page 4

© 1996 Microchip Technology Inc.

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