ATA01504D1C Ver la hoja de datos (PDF) - ANADIGICS

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ATA01504D1C

AGC Transimpedance Amplifier

ANADIGICS 

IIN connection

(refer to the equivalent circuit diagram) Bonding the

detector cathode to IIN (and thus drawing current from

the ATA01504) improves the dynamic range. Although

the detector may be used in the reverse direction for

input currents not exceeding 25 mA, the specifications

for optical overload will not be met.

10

9

8

7

I IIN

6

50

5

4

VDD = 5.5 V

3

VDD = 4.5 V 2

-2.1 - 1.6 -1.1 - 0.6 - 0.1 1

IIN (mA DC)

Figure 5: Transimpedance vs. IIN

ATA01504

VOUT Connection

The output pad should be connected via a coupling

capacitor to the next stage of the receiver channel

(filter or decision circuits), as the output buffers are

not designed to drive a DC coupled 50 ohm load

(this would require an output bias current of

approximately 36 mA to maintain a quiescent 1.8

Volts across the output load). If VOUT is connected to a

high input impedance decision circuit (>500 ohms),

then a coupling capacitor may not be required,

although caution should be exercised since DC

offsets of the photo detector/TIA combination may

cause clipping of subsequent gain or decision

circuits.

3.4

Output Collapse

heavy AGC 3.2

3.0

2.9

2.7

2.5

VDD =5.5 V

Linear Region

2.4

2.2

2.0

1.9

1.7

Rf

1.5

1.4

IIN

1.2

VOUT 1.0

0.8

0.7

0.5

0.3

VDD = 4.5 V

0.2

0.0

-4

-3

-2

-1

Bandwidth vs IIN

1.5

1.3

VDD=5.5 V

1.1

0.9

VDD=4.5 V

1501

IIN

0.7

0.5

50 0.3

0.1

- 2.1 - 1.6 - 1.1 - 0.6 - 0.1

IIN (mA DC)

IIN (mA DC)

Figure 7: VOUT vs. IIN

Sensitivity and Bandwidth

In order to guarantee sensitivity and bandwidth

performance, the TIA is subjected to a

comprehensive series of tests at the die sort level

(100% testing at 25 oC) to verify the DC parametric

performance and the high frequency performance

(i.e. adequate |S21|) of the amplifier. Acceptably high

|S21| of the internal gain stages will ensure low

amplifier input capacitance and hence low input

referred noise current. Transimpedance sensitivity

and bandwidth are then guaranteed by design and

correlation with RF and DC die sort test results.

Figure 6: Bandwidth vs. IIN

PRELIMINARY DATA SHEET - Rev 1

5

08/2001

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