NSI45025T1G(2009) Ver la hoja de datos (PDF) - ON Semiconductor
Número de pieza
componentes Descripción
Fabricante
NSI45025T1G Datasheet PDF : 6 Pages
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NSI45025T1G
TYPICAL PERFORMANCE CURVES
Minimum FR−4 @ 300 mm2, 1 oz Copper Trace, Still Air
60
50
40
30
20
10
VR
0
−10
−20
−10
0
10 20 30 40 50 60
Vak, ANODE−CATHODE VOLTAGE (V)
Figure 1. General Performance Curve for CCR
31
30
TA = 25°C
29
28
27
26
25
3.0
Non−Repetitive Pulse Test
4.0 5.0 6.0 7.0 8.0 9.0 10
Vak, ANODE−CATHODE VOLTAGE (V)
Figure 3. Pulse Current (Ireg(P)) vs.
Anode−Cathode Voltage (Vak)
35
30
TA = −40°C
[ −0.061 mA/°C
25
TA = 25°C
typ @ Vak = 7.5 V
20
TA = 85°C
[ −0.055 mA/°C
typ @ Vak = 7.5 V
15
10
5
DC Test Steady State, Still Air
0
0 1 2 3 4 5 6 7 8 9 10
Vak, ANODE−CATHODE VOLTAGE (V)
Figure 2. Steady State Current (Ireg(SS)) vs.
Anode−Cathode Voltage (Vak)
29
Vak @ 7.5 V
28 TA = 25°C
27
26
25
24
23
22
21
24 25 26 27 28 29 30 31 32 33 34 35
Ireg(P), PULSE CURRENT (mA)
Figure 4. Steady State Current vs. Pulse
Current Testing
30
800
Vak @ 7.5 V
29
TA = 25°C
700
500 mm2/2 oz
600
28
500 mm2/1 oz
500
27
300 mm2/2 oz
400 300 mm2/1 oz
26
300
100 mm2/2 oz
25
200 100 mm2/1 oz
24
0
5
10
15
20
25
30
35
TIME (s)
Figure 5. Current Regulation vs. Time
100
−40 −20
0
20
40
60
80
TA, AMBIENT TEMPERATURE (°C)
Figure 6. Power Dissipation vs. Ambient
Temperature @ TJ = 1505C
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