IL3585ETR13 Ver la hoja de datos (PDF) - Unspecified
Número de pieza
componentes Descripción
Fabricante
IL3585ETR13 Datasheet PDF : 8 Pages
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IL3585
Absolute Maximum Ratings(11)
Parameters
Storage Temperature
Ambient Operating Temperature
Voltage Range at A or B Bus Pins
Supply Voltage (1)
Digital Input Voltage
Digital Output Voltage
Symbol
TS
TA
VDD1, VDD2
Recommended Operating Conditions
Parameters
Symbol
Supply Voltage
VDD1
VDD2
Input Voltage at any Bus Terminal
VI
(separately or common mode)
VIC
High-Level Digital Input Voltage
VIH
Low-Level Digital Input Voltage
VIL
Differential Input Voltage (2)
VID
High-Level Output Current (Driver)
IOH
High-Level Digital Output Current
IOH
(Receiver)
Low-Level Output Current (Driver)
IOL
Low-Level Digital Output Current
IOL
(Receiver)
Ambient Operating Temperature
TA
Digital Input Signal Rise and Fall
tIR,tIF
Times
Insulation Specifications
Parameters
Creepage Distance (external)
Barrier Impedance Ω || pF
Leakage Current
Symbol
Min.
-65
-40
-7
-0.5
-0.5
-0.5
Typ.
Max.
150
100
12
7
VDD+0.5
VDD+1
Units
°C
°C
V
V
V
V
Test Conditions
Min.
3.0
4.5
2.4
3.0
-60
-8
-60
-8
-40
Typ.
Max.
5.5
5.5
12
-7
Units
V
V
V
0.8
V
+12/-7
V
60
mA
8
mA
60
mA
8
mA
85
°C
DC Stable
Test Conditions
VDD1= 3.3 V
VDD1= 5.0 V
Min.
8.077
Typ.
>1014||7
0.2
Max.
Units Test Conditions
µARMS
240 VRMS, 60 Hz
Safety & Approvals
IEC61010-1
TUV Certificate Numbers:
Classification
Model
IL3585
Approval Pending
Package
SOIC (0.3")
Pollution Degree
II
Material Group
III
Max. Working Voltage
300 VRMS
UL 1577
Component Recognition program. File #:
Rated 2500VRMS for 1 minute (SOIC)
Approval Pending
Electrostatic Discharge Sensitivity
This product has been tested for electrostatic sensitivity to the limits stated in the specifications. However, NVE recommends that all integrated
circuits be handled with appropriate care to avoid damage. Damage caused by inappropriate handling or storage could range from performance
degradation to complete failure.
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