DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

L9380(1998) Ver la hoja de datos (PDF) - STMicroelectronics

Número de pieza
componentes Descripción
Fabricante
L9380
(Rev.:1998)
ST-Microelectronics
STMicroelectronics ST-Microelectronics
L9380 Datasheet PDF : 12 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
L9380
In application which don’t use the overload pro-
tection or if one channel is not used, the Timer pin
of this channel must be connected to ground and
the drain pin with a resistor to Vbat.
The timing characteristic illustrates the function
and the meaning of VDSmin and Toff (see figure 4).
The input current of the overload sense compara-
tor is specified as ISmax. The sum IPR + IDmax gen-
erates a drop across the external resistor RD if
the drain pin voltage is higher than the source pin
(see Fig. 5). In the switching point the comparator
input source pin currents are equal and the half of
the specified current ISmax. For an offset compen-
sation equal external resistors (RD = RS) at drain
and source pin are imperative. The drain sense
comparator, which detects the overload, has a
symmetrical hysteresis of 20mV (see Fig. 6). Ex-
ceeding the source pin voltage by 10mV with re-
spect to the drain voltage forces the timer capaci-
tor to discharge. Decreasing the source pin
voltage 10mV lower than the drain pin voltage an
overload of the external MOS is detected and the
timer capacitor will be loaded. After reaching a
voltage at pin CT higher than the timer threshold
VThi the influenced channel is switched off. In this
case the overload is stored in the timer capacitor.
The timer capacitor will be discharged with a
’High’ signal at the input (see Fig. 4). After reach-
ing the lower timer threshold VTLo the overload
protection is reset and the channel is able to
switch on again.
The application diagram is shown in Fig. 7. Be-
cause of the transients present at the power lines
during operation and possible disturbances in the
system the external resistors are necessary.
Positive ISO-Pulses at Drain, Gate Source are
clamped with an active clamping structure. The
clamping voltage is less than 60V. Negative
Pulses are only clamped with the ESD-Structure
less than -15V. This transients lower than -15V
can influence the other channels.
In order to protect the transistor against overload
and gate breakdown protection diodes between
gate and source and gate and drain has to be
connected. In case of overvoltage into VS (VS >
20V) the charge pump oscillation is stopped.
Then the charge pump capacitor will be loaded by
Figure 6. Comparator hysteresis.
VT
D98AT394
-10mV VDr +10mV
VSo
a diode and a resistor in series up to VS (see
Block Diagram). In this case the channels are not
influenced. In reverse battery condition the pins
D1, D2, S1, S2 follow the battery potential down
to -13V (high impedance) and the gate driver pins
G1, G2 is referred to S1, S2. In this way it is as-
sured that M1 and M2 will not be driven into the
linear conductive mode. This protection function
is operating for VS1, VS2 down to -15V. The gate
driver output G3 is referred to the D1 in this case.
This function guarantees that the source to
source connected N-Channel MOS transistors M3
and M4 remains OFF.
All the supplies and the in- and output of the PC-
Board are supplied with a 40 wires flat cable (not
used wires are left open). This cable is submitted
to the RF in the strip-line like described in DIN
40839-4 or ISO 11456-5.
The measured circuit was build up on a PCB
board with ground plane. In the frequency range
from 1MHz to 400MHz and 80% AM-modulation
of 1KHz with field strength of 200V/m no influence
to the basic function was detected on a typical de-
vice. The failure criteria is an envelope of the out-
put signal with 20% in the amplitude and 2% in
the time.
6/12

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]