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MC33063 Ver la hoja de datos (PDF) - Fairchild Semiconductor

Número de pieza
componentes Descripción
Fabricante
MC33063
Fairchild
Fairchild Semiconductor Fairchild
MC33063 Datasheet PDF : 7 Pages
1 2 3 4 5 6 7
Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device
reliability. The absolute maximum ratings are stress ratings only.
Symbol
VCC
VI(COMP)
VC(SW)
VE(SW)
VCE(SW)
VC(DR)
ISW
TSTG
PD
Parameter
Supply Voltage
Comparator Input Voltage Range
Switch Collector Voltage
Switch Emitter Voltage
Switch Collector to Emitter Voltage
Driver Collector Voltage
Switch Current
Storage Temperature Range
Power Dissipation
SOP
DIP
Min.
-0.3
-65
Max.
40
+40
40
40
40
40
1.5
+150
0.8
1
Unit
V
V
V
V
V
V
A
°C
W
Electrical Characteristics
VCC = 5.0V, TA = 0°C to +70°C for MC34063, TA = -40°C to +85°C for MC33063, unless otherwise specified.
Symbol
Parameter
Conditions
Min. Typ. Max. Units
Oscillator
ICHG
IDISCHG
V(OSC)
K
VSENSE(CL)
Charging Current
Discharging Current
Oscillator Amplitude
Discharge-to-Charge Current Ratio
Current Limit Sense Voltage
VCC=5 to 40V, TA=25°C
VCC=5 to 40V, TA=25°C
TA=25°C
V7=VCC, TA=25°C
ICHG=IDISCHG, TA=25°C
22
31
42
µA
140 190 260
µA
0.5
V
5.2
6.1
7.5
250 300 350 mV
Output Switch
VCE(SAT)1
VCE(SAT)2
Saturation Voltage 1(1)
Saturation Voltage 2(1)
GI(DC)
DC Current Gain(1)
IC(OFF)
Collector Off-State Current(1)
ISW=1.0A, VC(driver)=VC(SW)
ISW=1.0A, VC(driver)=50mA
ISW=1.0A,
VCE=5.0V, TA=25°C
VCE=40V, TA=25°C
0.95 1.30
V
0.45 0.70
V
50
180
0.01 100.00 µA
Comparator
VTH
ΔVTH
IBIAS
Threshold Voltage
Threshold Voltage Line Regulation
Input Bias Current
VCC=3 to 40V
VI=0V
1.21 1.24 1.29
V
2
5
mV
50
400
nA
Total Device
ICC
Supply Current
MC34063
MC33063
VCC=5 to 40V, CT=0.001µF,
V7=VCC, V5>VTH, pin 2=GND
4
mA
5
Note:
1. Output switch tests are performed under pulsed conditions to minimize power dissipation.
© 2001 Fairchild Semiconductor Corporation
MC34063A/MC33063A • Rev. 1.0.3
3
www.fairchildsemi.com

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