HCTS299MS Ver la hoja de datos (PDF) - Intersil

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Fabricante

HCTS299MS

Radiation Hardened 8-Bit Universal Shift Register; Three-State

Intersil 

HCTS299MS

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE

GROUPS

METHOD

TEST

PRE RAD

POST RAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

NOTE: 1. Except FN test which will be performed 100% Go/No-Go.

READ AND RECORD

PRE RAD

POST RAD

1, 9

Table 4 (Note 1)

TABLE 8. STATIC BURN-IN AND DYNAMIC

OPEN

GROUND

1/2 VCC = 3V ± 0.5V

VCC = 6V ± 0.5V

STATIC BURN-IN I TEST CONNECTIONS (Note 1)

8, 17

1 - 7, 9 - 16, 18, 19

-

20

STATIC BURN-IN II TEST CONNECTIONS (Note 1)

8, 17

10

-

1 - 7, 9, 11 - 16, 18 - 20

DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)

-

2, 3, 10, 18, 19

4 - 8, 13 - 17

1, 9, 20

NOTES:

1. Each pin except VCC and GND will have a resistor of 10kΩ ± 5% for static burn-in

2. Each pin except VCC and GND will have a resistor of 680Ω ± 5% for dynamic burn-in

OSCILLATOR

50kHz

25kHz

-

-

-

-

12

11

TABLE 9. IRRADIATION TEST CONNECTIONS

OPEN

GROUND

VCC = 5V ± 0.5V

8, 17

10

1 - 7, 9, 11 - 16, 18 - 20

NOTE: Each pin except VCC and GND will have a resistor of 47KΩ ± 5% for irradiation testing.

Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.

Spec Number 518640

631

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