54RHSCT630CS Ver la hoja de datos (PDF) - Dynex Semiconductor

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componentes Descripción

Fabricante

54RHSCT630CS

Radiation hard 16-Bit ParallelError Detection & Correction

Dynex Semiconductor 

54HSC/T630

S1 S0 Function

L

H

Start READ

H H Latch data & flag errors

H

L

Correct data & Output syndrome bits

Figure 3: Error Detection and Correction Using Two EDAC Units

DEFINITION OF SUBGROUPS

Subgroup

1

2

3

9

10

11

Definition

Static characteristics specified in Table 6 at +25°C

Static characteristics specified in Table 6 at +125°C

Static characteristics specified in Table 6 at -55°C

Switching characteristics specified in Table 7 at +25°C

Switching characteristics specified in Table 7 at +125°C

Switching characteristics specified in Table 7 at -55°C

DC CHARACTERISTICS AND RATINGS

Parameter

Supply Voltage

Input Voltage

Current Through Any Pin

Operating Temperature

Storage Temperature

Min

Max

-0.5

7

VSS-0.3 VDD+0.3

-20

+20

-55

125

-65

150

Table 5: Absolute Maximum Ratings

Units

V

V

mA

°C

°C

Note: Stresses above those listed may cause permanent

damage to the device. This is a stress rating only and

functional operation of the device at these conditions, or at

any other condition above those indicated in the operations

section of this specification, is not implied. Exposure to

absolute maximum rating conditions for extended periods

may affect device reliability.

4/10

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