MC10124FN Ver la hoja de datos (PDF) - ON Semiconductor
Número de pieza
componentes Descripción
Fabricante
MC10124FN Datasheet PDF : 8 Pages
| |||
MC10124
ELECTRICAL CHARACTERISTICS (continued)
TEST VOLTAGE VALUES (Volts)
(mA)
@ Test Temperature
VR
VCC
VEE
II
Iin
–30°C +2.40
+5.00
–5.2
–10
+1.0
+25°C +2.40
+5.00
–5.2
–10
+1.0
+85°C +2.40
+5.00
–5.2
–10
+1.0
Characteristic
Negative Power Supply Drain
Current
Symbol
IE
Pin
Under
Test
8
TEST VOLTAGE APPLIED TO PINS LISTED BELOW
VR
VCC
VEE
II
Iin
9
8
Gnd
16
Positive Power Supply Drain
Current
ICCH
9
ICCL
9
9
8
9
8
Reverse Current
IR
6
6
9
8
7
7
9
8
16
5,6,7,10,11,16
16
16
Forward Current
IF
6
9
8
16
7
9
8
16
Input Breakdown Voltage
BVin
6
7
9
8
9
8
6
5,7,10,11,16
7
6,16
Clamp Input Voltage
VI
6
9
8
6
16
7
9
8
7
16
High Output Voltage
VOH
1
9
8
16
3
9
8
16
Low Output Voltage
VOL
1
9
8
16
3
9
8
16
High Threshold Voltage
VOHA
1
9
8
16
3
9
8
16
Low Threshold Voltage
VOLA
1
9
8
16
3
9
8
16
Switching Times
(50Ω Load)
+7.0 V
–3.2 V
+2.0 V
Propagation Delay
t6+1+
1
9
8
16
(+3.5Vdc to 50%)1 t6–1–
1
9
8
16
t7+1+
1
9
8
16
t7–1–
1
9
8
16
t7+3–
3
9
8
16
t7–3+
3
9
8
16
Rise Time
(20 to 80%)
t1+
1
9
8
16
Fall Time
(20 to 80%)
t1–
1
9
8
16
1. See switching time test circuit. Propagation delay for this circuit is specified from +1.5Vdc in to the 50% point on the output waveform. The
+3.5Vdc is shown here because all logic and supply levels are shifted 2 volts positive.
Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been
established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained.
Outputs are terminated through a 50–ohm resistor to –2.0 volts. Test procedures are shown for only one gate. The other gates are tested in the
same manner.
http://onsemi.com
4
Share Link: 