MAX5012 Ver la hoja de datos (PDF) - Maxim Integrated
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MAX5012 Datasheet PDF : 8 Pages
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12-Bit, 100Msps ECL DAC
ELECTRICAL CHARACTERISTICS (continued)
(VEE = -5.2V, RSET = 7.5kΩ, CONTROL AMP IN = REF OUT, VOUT = 0V, TA = TMIN - TMAX, unless otherwise noted.)
PARAMETERS
CONDITIONS
TEST
MAX5012A
LEVEL MIN TYP MAX
MAX5012B
MIN TYP MAX
POWER-SUPPLY REQUIREMENTS
Negative Supply Voltage
IV
-5.46 -5.2 -4.94 -5.46 -5.2 -4.94
Negative Supply Current (-5.2V) TA = +25°C
I
Full temperature
VI
115
140
148
115
140
148
Nominal Power Dissipation
V
600
600
UNITS
V
mA
mA
mW
±5% of VEE,
Power-Supply Rejection Ratio external reference,
I
TA = +25°C
VOLTAGE INPUT AND CONTROL
Reference Input Impedance
TA = +25°C
V
Reference Multiplying
Bandwidth
TA = +25°C
V
Internal Reference Voltage
VI
Internal Reference Voltage Drift
V
Amplifier Input Impedance
TA = +25°C
V
Amplifier Input Bandwidth
TA = +25°C
V
DIGITAL INPUTS
Logic 1 Voltage
Full temperature
VI
Logic 0 Voltage
Full temperature
VI
Logic 1 Current
Full temperature
VI
Logic 0 Current
Full temperature
VI
Input Capacitance
TA = +25°C
V
Input Setup Time (tS)
TA = +25°C
IV
Full temperature
IV
Input Hold Time (tH)
TA = +25°C
IV
Full temperature
IV
Latch Pulse Width (tPWL, tPWH) TA = +25°C
IV
30
100
30
100
µA/V
-1.15
3
40
-1.20
50
3
1
-1.25
-1.15
3
40
-1.20
50
3
1
-1.25
kΩ
MHz
V
ppm/°C
MΩ
MHz
-1.0 -0.8
-1.0 -0.8
V
-1.7 -1.5
-1.7 -1.5
V
20
20
µA
10
10
µA
3
3
pF
3
2
3
2
ns
3.5
3.5
ns
0.5
0
0.5
0
ns
0.5
0.5
ns
5.0
4.0
5.0
4.0
ns
Note 1: Gain is measured as a ratio of the full-scale current to ISET. The ratio is nominally 128.
Note 2: Measured as voltage at mid-scale transition to ±0.024%; RL = 50Ω.
Note 3: Measured from the rising edge of Latch Enable to where the output signal has left a 1LSB error band.
Note 4: Glitch is measured as the largest single transient.
Note 5:
Calculated using
IFS
=
128
x
Control Amp
RSET
In
TEST LEVEL CODES
All electrical characteristics are subject to the following
conditions:
All parameters having min/max specifications are guar-
anteed. The Test Level column indicates the specific
device testing actually performed during production
and Quality Assurance inspection. Any black section in
the data column indicates that the specification is not
tested at the specified condition.
TEST LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA = +25°C, and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and
characterization data.
Parameter is a typical value for information purposes only.
100% production tested at TA = +25°C. Parameter is
guaranteed over specified temperature range.
_______________________________________________________________________________________ 3
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