HFA1113/883
Test Circuit (Applies to Table 1)
NC
K3
VL
0.1
0.1 50
V+
ICC
NC
-VIN
+VIN
K2 1
2
1
0.1
K1 2
+IBIAS =
VZ
100K
100K (0.01%)
VZ
-
+
0.1
HA-5177
+
10
0.1
0.1
7
2
-
5
DUT
3
+
8
4
50
0.1
470pF
510
510
+
-
x100
Vos =
VY
100
VY
6
100
100
1K
VOUT
K3
0.1
+ 10 0.1 NC
K4
NOTE:
IEE
V-
VH
Terminal Numbers Refer to CerDIP Package
0.1 All Resistors = ±1% (Ω)
All Capacitors = ±10% (µF)
Unless Otherwise Noted
Chip Components Recommended
For AV = +1, K1 = Position 1, K2 = Position 1
For AV = +2, K1 = Position 1, K2 = Position 2, -VIN = 0V
For AV = -1, K1 = Position 1, K2 = Position 2, +VIN = 0V
Test Waveforms
SIMPLIFIED TEST CIRCUIT FOR LARGE AND SMALL SIGNAL PULSE RESPONSE (Applies to Table 3)
AV = +1 or +2 TEST CIRCUIT
AV = -1 TEST CIRCUIT
V+
V+
VIN
RS
50Ω
7
3+ 6
2-
4
50Ω
RG
VOUT
2
50Ω
VIN
RS
50Ω
27
-
6
3+
4
50Ω
VOUT
2
50Ω
V-
NOTE:
VS = ±5V, RG = 0Ω for AV = +2, RG = ∞ for AV = +1
RF = Internal, RS = 50Ω
RL = 100Ω For Small and Large Signals
Terminal Numbers Refer to CerDIP Package
V-
NOTE:
VS = ±5V, AV = -1
RF = Internal
RS = 50Ω, RL = 100Ω For Small and Large Signals
Terminal Numbers Refer to CerDIP Package
VOUT
+2.5V
+SR
-2.5V
LARGE SIGNAL WAVEFORM
90%
10%
90%
10%
+2.5V
-SR
-2.5V
VOUT
+250mV
TR , +OS
-250mV
SMALL SIGNAL WAVEFORM
90%
90%
10%
10%
+250mV
TF , -OS
-250mV
Spec Number 511106-883
194