74ABT2952 Ver la hoja de datos (PDF) - Fairchild Semiconductor
Número de pieza
componentes Descripción
Fabricante
74ABT2952 Datasheet PDF : 8 Pages
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Absolute Maximum Ratings(Note 1)
Storage Temperature
−65°C to +150°C
Ambient Temperature under Bias
−55°C to +125°C
Junction Temperature under Bias
−55°C to +150°C
VCC Pin Potential to Ground Pin
Input Voltage (Note 2)
−0.5V to +7.0V
−0.5V to +7.0V
Input Current (Note 2)
−30 mA to +5.0 mA
Voltage Applied to Any Output
in the Disable or
Power-Off State
−0.5V to +5.5V
in the HIGH State
Current Applied to Output
−0.5V to VCC
in LOW State (Max)
DC Latchup Source Current
twice the rated IOL (mA)
−500 mA
Over Voltage Latchup (I/O)
10V
Recommended Operating
Conditions
Free Air Ambient Temperature
Supply Voltage
Minimum Input Edge Rate (∆V/∆t)
Data Input
Enable Input
Clock Input
−40°C to +85°C
+4.5V to +5.5V
50 mV/ns
20 mV/ns
100 mV/ns
Note 1: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
Symbol
Parameter
Min
Typ
Max
Units
VCC
Conditions
VIH
Input HIGH Voltage
VIL
Input LOW Voltage
VCD
Input Clamp Diode Voltage
VOH
Output HIGH Voltage
VOL
Output LOW Voltage
VID
Input Leakage Test
2.0
V
Recognized HIGH Signal
0.8
V
Recognized LOW Signal
2.5
2.0
4.75
−1.2
V
0.55
V
V
Min IIN = −18 mA (Non I/O Pins)
IOH = −3 mA (An, Bn)
IOH = −32 mA (An, Bn)
Min IOL = 64 mA (An, Bn)
0.0 IID = 1.9 µA (Non-I/O Pins)
All Other Pins Grounded
IIH
Input HIGH Current
IBVI
IBVIT
IIL
Input HIGH Current Breakdown Test
Input HIGH Current Breakdown Test (I/O)
Input LOW Current
IIH + IOZH Output Leakage Current
1
µA
Max VIN = 2.7V (Non-I/O Pins) (Note 3)
1
VIN = VCC (Non-I/O Pins)
7
µA
Max VIN = 7.0V (Non-I/O Pins)
100
µA
Max VIN = 5.5V (An, Bn)
−1
µA
Max VIN = 0.5V (Non-I/O Pins) (Note 3)
−1
VIN = 0.0V (Non-I/O Pins)
10
µA
0V–5.5V VOUT = 2.7V (An, Bn);
OEA or OEB = 2.0V
IIL + IOZL Output Leakage Current
−10
µA
0V–5.5V VOUT = 0.5V (An, Bn);
OEA or OEB = 2.0V
IOS
Output Short-Circuit Current
ICEX
Output HIGH Leakage Current
IZZ
Bus Drainage Test
−100
−275
mA
Max VOUT = 0V (An, Bn)
50
µA
Max VOUT = VCC (An, Bn)
100
µA
0.0V VOUT = 5.5V (An, Bn);
All Others GND
ICCH
ICCL
ICCZ
Power Supply Current
Power Supply Current
Power Supply Current
250
µA
Max All Outputs HIGH
30
mA
Max All Outputs LOW
50
µA
Max Outputs 3-STATE;
All Others GND
ICCT
ICCD
Additional ICC/Input
Dynamic ICC
(Note 4)
No Load
2.5
mA
Max VI = VCC − 2.1V; All Others
at VCC or GND
0.18 mA/MHz Max Outputs Open
OEA or OEB = GND,
Non-I/O = GND or VCC
One Bit toggling, 50% duty cycle
(Note 4)
Note 3: Guaranteed, but not tested.
Note 4: For 8-bit toggling, ICCD < 1.4 mA/MHz.
3
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