No.
Item
15 High
Appearance
Temperature
High Humidity Capacitance
(Steady)
Change
Q or D.F.
Specification
No defects or abnormalities.
Within +/-7.5% or +/-0.75pF (Whichever is larger)
Q≧100+10C/3 C:Nominal Capacitance(pF)
I.R.
More than 500MΩ or 25Ω・F (Whichever is smaller)
16 Durability
Appearance No defects or abnormalities.
Capacitance Within +/-3% or +/-0.3pF (Whichever is larger)
Change
Q or D.F. Q≧200+10C C:Nominal Capacitance(pF)
I.R.
More than 1000MΩ or 50Ω・F (Whichever is smaller)
Table A Capacitance Change between at Reference Temp. and at each Temp. (%)
Char.
-55℃
Max.
Min.
-30℃
Max.
Min.
-10℃
Max.
Min.
5C
0.58
-0.24
0.4
-0.17
0.25
-0.11
Test Method (Ref. Standard:JIS C 5101, IEC60384)
Solder the capacitor on the test substrate shown in Fig.3.
Test Temperature :
40+/-2℃
Test Humidity :
90%RH to 95%RH
Test Time :
500+/-12h
Test Voltage :
Rated Voltage
Charge/Discharge Current : 50mA max.
Post-treatment :
Let sit for 24+/-2hours at room temperature, then measure.
Solder the capacitor on the test substrate shown in Fig.3.
Test Temperature :
Maximum Operating Temperature+/-3℃
Test Time :
1000+/-12h
Test Voltage :
200% of the rated voltage
Charge/Discharge Current : 50mA max.
Post-treatment :
Let sit for 24+/-2hours at room temperature, then measure.
GRM1885C2A4R3BA01-01A