ADG781 Ver la hoja de datos (PDF) - Analog Devices

Número de pieza

componentes Descripción

Fabricante

ADG781

2.5 Ω Quad SPST Switches in Chip Scale Package

Analog Devices 

Test Circuits

V

S

D

IDS

VS

RON = V/IDS

Test Circuit 1. On Resistance

ADG781/ADG782/ADG783

IS (OFF)

A

S

VS

ID (OFF)

D

A

VD

Test Circuit 2. Off Leakage

S

NC

ID (ON)

D

A

VD

NC = NO CONNECT

Test Circuit 3. On Leakage

VDD

0.1␮F

VIN ADG781 50%

50%

VDD

VIN ADG782 50%

50%

S

D

VOUT

VS

IN

RL

300⍀

CL

35pF

VOUT

VS 90%

90%

GND

tON

tOFF

Test Circuit 4. Switching Times

VDD

0.1␮F

VIN

0V

50%

VDD

S1

D1

VS1

S2

D2

VS2

IN1, IN2

VIN

ADG783

GND

RL2

300⍀

CL2 VOUT2

35pF

RL1

300⍀

CL1 VOUT1

35pF

VOUT1

0V

90%

90%

VOUT2

0V

tD

Test Circuit 5. Break-Before-Make Time Delay, tD

50%

90%

90%

tD

RS

VS

VDD

VDD

S

D

IN

GND

SW ON

VIN

SW OFF

VOUT

CL

1nF

VOUT

Test Circuit 6. Charge Injection

QINJ = CL ؋ VOUT

VOUT

VDD

0.1␮F

VDD

0.1␮F

IN

VIN

VDD

S

D

GND

50⍀

NETWORK

ANALYZER

50⍀

VS

VOUT

RL

50⍀

NETWORK

ANALYZER

VOUT

RL

50⍀

50⍀

VS

VDD

D1

S1

NC

S2

IN

D2

RL

50⍀

GND

REV. C

OFF ISOLATION = 20 LOG VOUT

VS

Test Circuit 7. Off Isolation

–7–

CHANNEL-TO-CHANNEL

CROSSTALK = 20 LOG VOUT

VS

Test Circuit 8. Channel-to-Channel Crosstalk

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