N74F827DB Ver la hoja de datos (PDF) - NXP Semiconductors.

Número de pieza

componentes Descripción

Fabricante

N74F827DB

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NXP Semiconductors. 

NXP Semiconductors

74F827

10-bit buffer/line driver; non-inverting; 3-state

VI 90 %

tW

negative

pulse

VM

10 %

0V

tf

tr

VI

positive

pulse

90 %

VM

10 %

0V

tW

90 %

VM

tr

tf

VM

10 %

001aac221

VI

G

VCC

VO

DUT

RT

a. Input pulse definition

b. Test circuit

Fig 7.

Test data and VEXT levels are given in Table 8.

RL = Load resistance.

CL = Load capacitance including jig and probe capacitance.

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

VEXT = Test voltage for switching times.

Test circuit for measuring switching times

VEXT

RL

CL

RL

mna616

Table 8.

Input

VI

3.0 V

Test data

fI

1 MHz

tW

500 ns

tr, tf

≤ 2.5 ns

Load

CL

50 pF

RL

500 Ω

VEXT

tPHL, tPLH

open

tPZH, tPHZ

open

tPZL, tPLZ

7.0 V

74F827_4

Product data sheet

Rev. 04 — 29 January 2010

© NXP B.V. 2010. All rights reserved.

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