R3130N×××A/C, R3131N×××A/C
TEST CIRCUITS
• Test Circuit for Supply Current
ISS
VIN
VDD
R313×N
Series OUT
GND
• Test Circuit for Detector Threshold
(CMOS Output type; pull-up part is not neces-
sary.)
5V
VDD
470kΩ
VIN
R313×N
Series OUT
VOUT
GND
• Test Circuit for “H” Output Voltage
(CMOS Output Type only)
VDD
VIN
R313×N
Series
OUT
GND
IOUT
VOH
V
• Test Circuit for “L” Output Voltage
VDD
VIN
R313×N
OUT
Series
VOL
V
GND
IOUT
• Test Circuit for Off Leakage Current
VDD
Ioz
VIN
R313×N
Series OUT
VDS
GND
• Test Circuit for Output Delay Time
(CMOS Output type; pull-up is not necessary.)
(VDET)+1.0V
Input
Voltage 1.0V
GND
Output 100%
Voltage 50%
GND
VIN
R3130N Series
R3131N Series
Tdelay
VDD
R313×N
VOUT
Series OUT
GND
20