MX29F800CB Ver la hoja de datos (PDF) - Integrated Device Technology

Número de pieza

componentes Descripción

Fabricante

MX29F800CB

8M-BIT [1024K x 8 / 512K x 16] SINGLE VOLTAGE 5V ONLY FLASH MEMORY

Integrated Device Technology 

SWITCHING TEST CIRCUITS

Vcc

0.1uF

TESTED DEVICE

MX29F800C T/B

R2

Vcc

R1

CL

Test Condition

Output Load : 1 TTL gate

Output Load Capacitance,CL : 30PF for 70ns

Rise/Fall Times : 10ns

Input pulse levels: 0.45V/0.7xVcc

Reference levels for measuring timing :0.8V, 2.0V

DIODES=IN3064

OR EQUIVALENT

R1=6.2K ohm

R2=2.7K ohm

SWITCHING TEST WAVEFORMS

0.7xVCC

0.45V

INPUT

2.0V

0.8V

TEST POINTS

2.0V

0.8V

OUTPUT

P/N:PM1493

REV. 1.2, JUL. 05, 2012

17

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