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LH28F016SU

16M (1M × 16, 2M × 8) Flash Memory

Sharp Electronics 

LH28F016SU

16M (1M × 16, 2M × 8) Flash Memory

Timing Nomenclature

All 3.3 V system timings are measured from where signals cross 1.5 V. For 5.0 V systems use the standard JEDEC

crosspoint definitions. Each timing parameter consists of 5 characters. Some common examples are defined below:

tCE tELQV time (t) from CE » (E) going low (L) to the outputs (Q) becoming valid (V)

tOE tGLQV time (t) from OE » (G) going low (L) to the outputs (Q) becoming valid (V)

tACC tAVQV time (t) from address (A) valid (V) to the outputs (Q) becoming valid (V)

tAS tAVWH time (t) from address (A) valid (V) to WE » (W) going high (H)

tDH tWHDX time (t) from WE » (W) going high (H) to when the data (D) can become undefined (X)

PIN CHARACTERS

A Address Inputs

D Data Inputs

Q Data Outputs

E CE » (Chip Enable)

G OE» (Output Enable)

W WE (Write Enable)

P RP » (Deep Power-Down Pin)

R RY »/BY » (Ready/Busy)

V Any Voltage Level

Y 3/5 » Pin

5 V VCC at 4.5 V Min.

3 V VCC at 3.0 V Min.

PIN STATES

H High

L Low

V Valid

X Driven, but not necessarily valid

Z High Impedance

16

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