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3N80K5(2014) Ver la hoja de datos (PDF) - STMicroelectronics

Número de pieza
componentes Descripción
Fabricante
3N80K5 Datasheet PDF : 23 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
STD3N80K5, STF3N80K5, STP3N80K5, STU3N80K5
3
Test circuits
Test circuits
Figure 18. Switching times test circuit for
resistive load
Figure 19. Gate charge test circuit
VDD
VD
VGS
RG
PW
RL
2200
μF
D.U.T.
3.3
μF VDD
12V
47kΩ
1kΩ
100nF
Vi=20V=VGMAX
2200
μF
IG=CONST
2.7kΩ
100Ω
D.U.T.
VG
47kΩ
PW
AM01468v1
1kΩ
AM01469v1
Figure 20. Test circuit for inductive load
switching and diode recovery times
Figure 21. Unclamped inductive load test circuit
G
25 Ω
A
D
D.U.T.
S
B
AA
FAST
DIODE
L=100μH
B
3.3
B
μF
D
G
RG
S
1000
μF
VDD
Vi
L
VD
2200
3.3
μF
μF
VDD
ID
D.U.T.
AM01470v1
Figure 22. Unclamped inductive waveform
V(BR)DSS
VD
Pw
AM01471v1
Figure 23. Switching time waveform
ton
tdon
tr
toff
tdoff tf
VDD
IDM
ID
0
VDD
90%
10% VDS
90%
VGS
90%
10%
AM01472v1
0
10%
AM01473v1
DocID025000 Rev 3
9/23

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