74AHC273-Q100 Ver la hoja de datos (PDF) - NXP Semiconductors.
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74AHC273-Q100 Datasheet PDF : 19 Pages
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NXP Semiconductors
74AHC273-Q100; 74AHCT273-Q100
Octal D-type flip-flop with reset; positive-edge trigger
VI 90 %
negative
pulse
GND
VI
positive
pulse
10 %
GND
VM
10 %
tf
tr
90 %
VM
VI
G
RT
tW
tW
VCC
DUT
VM
tr
tf
VM
VO
CL
001aah768
Test data is given in Table 9.
Definitions test circuit:
RT = termination resistance should be equal to output impedance Zo of the pulse generator.
CL = load capacitance including jig and probe capacitance.
Fig 10. Test circuit for measuring switching times
Table 9. Test data
Type
74AHC273-Q100
74AHCT273-Q100
Input
VI
VCC
3.0 V
tr, tf
3.0 ns
3.0 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
Test
tPLH, tPHL
tPLH, tPHL
74AHC_AHCT273_Q100
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 1 — 27 March 2013
© NXP B.V. 2013. All rights reserved.
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