MJF6388(2002) Ver la hoja de datos (PDF) - ON Semiconductor
Número de pieza
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MJF6388 Datasheet PDF : 8 Pages
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MJF6388 MJF6668
RB & RC VARIED TO OBTAIN DESIRED CURRENT LEVELS
D1, MUST BE FAST RECOVERY TYPES, e.g.,
ăMUR110 USED ABOVE IB ≈ 100 mA
ăMSD6100 USED BELOW IB ≈ 100 mA
V1
APPROX.
+12 V
V2
APPROX.
-ā8 V
RB
51 D1
≈Ă8 k
-4 V
25 µs
VCC
+30 V
RC
TUT
SCOPE
≈Ă120
tr, tf ≤ 10 ns
DUTY CYCLE = 1%
FOR td AND tr, D1 IS DISCONNECTED
AND V2 = 0
FOR NPN TEST CIRCUIT REVERSE ALL POLARITIES.
Figure 2. Switching Times Test Circuit
NPN
MJF6388
PNP
MJF6668
7
5
3
ts
tf
1
0.7
tr
0.3
VCC = 30 V
0.2 IC/IB = 250
IB1 = IB2
0.1 TJ = 25°C
0.07
0.1
0.2
0.5
1
td
2
5
10
IC, COLLECTOR CURRENT (AMPS)
10
7
5 tr
3
2
1
0.7
0.5
0.3
0.2
tf
VCC = 30 V
IC/IB = 250
IB1 = IB2
TJ = 25°C
ts
td
0.1
0.1
0.2 0.3 0.5 0.7 1
23
IC, COLLECTOR CURRENT (AMPS)
Figure 3. Typical Switching Times
5 7 10
20
10
5
3
2
1
0.5
0.3
0.2
0.1
0.05
0.03
0.02
1
TJ = 150°C
dc
5 ms
100 µs
1Ăms
CURRENT LIMIT
SECONDARY BREAKDOWN LIMIT
THERMAL LIMIT @ TC = 25°C
(SINGLE PULSE)
23 5
10
20 30 50
100
VCE, COLLECTOR-EMITTER VOLTAGE (VOLTS)
Figure 4. Maximum Forward Bias
Safe Operating Area
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