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TLP124BV Ver la hoja de datos (PDF) - Toshiba

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componentes Descripción
Fabricante
TLP124BV Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
Current Transfer Ratio
Classification
Rank BV
Standard
Current Transfer Ratio (min.)
Ta = 25°C
Ta = 25~75°C
IF = 1mA
VCE = 0.5V
IF = 0.5mA
VCE = 1.5V
IF = 1mA
VCE = 0.5V
200%
100%
100%
100%
50%
50%
Marking Of
Classification
BV
BV, Blank
(Note) Application type name for certification test, please use standard product type name, i. e.
TLP124 (BV): TLP124
TLP124
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
Forward current
Forward current derating
Peak forward current
(100μs pulse, 100pps)
Reverse voltage
Junction temperature
Collectoremitter voltage
Emittercollector voltage
Collector current
Peak collector current
(10ms pulse, 100pps)
Power dissipation
Power dissipation derating
(Ta 25°C)
Junction temperature
Storage temperature range
Operating temperature range
Lead soldering temperature (10s)
Total package power dissipation
Total package power dissipation
derating (Ta 25°C)
Isolation voltage
(AC, 1min., R.H. 60%)
(Note 1)
IF
ΔIF / °C
IFP
VR
Tj
VCEO
VECO
IC
ICP
PC
ΔPC / °C
Tj
Tstg
Topr
Tsol
PT
ΔPT / °C
BVS
50
0.7 (Ta 53°C)
1
5
125
80
7
50
100
150
1.5
125
55~125
55~100
260
200
2.0
3750
mA
mA / °C
A
V
°C
V
V
mA
mA
mW
mA / °C
°C
°C
°C
°C
mW
mW / °C
Vrms
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
(Note 1) Device considered a two terminal device: Pins1, 3 shorted together and pins 4, 6 shorted together.
2
2007-10-01

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