Test Circuit 7: Switching Time Test Circuit
IF=3 mA (P.G)
(f=50 kHz , duty=50%,
ttrr==ttff==5Lensss) than 5 ns )
IF
1
VCC
VCC VO
6
5 0.1µF
3
GND 4
SHIELD
CL
5V
IF
5 kΩ
620 Ω
VOH
VO
VOL
CL is approximately 15 pF which includes
probe and stray capacitance.
P.G.: Pulse generator
tpLH
1.3V
tr
TLP105
50%
tpHL
90%
10%
tf
Test Circuit 8: Switching Time Test Circuit
IF=3 mA (P.G)
(f=50 kHz , duty=50%,
trt=rt=f=tf=Le5snssth)an 5 ns )
IF
1
6
VCC
5
0.1µF
3
GND 4
SHIELD
VO
CL
IF
VCC VOH
VO
VOL
CL is approximately 15 pF which includes
probe and stray capacitance.
P.G.: Pulse generator
tpLH
1.3V
tr
50%
tpHL
90%
10%
tf
Test Circuit 9: Common Mode Transient Immunity Test Circuit
SW
A
IF
→
B
1
6
90%
VCC
5 0.1µF
VO
VCM
10%
tr
3
GND 4
SHIELD
VCC
・SW A : IF=5 mA
VCM
VO
1V
・SW B : IF=0 mA
1000V
tf
CMH
17V
CML
CM H
=
800(V )
t f (µs)
CM L
=
800(V )
t r (µs)
© 2019
5
Toshiba Electronic Devices & Storage Corporation
2019-05-27