STV7620 Ver la hoja de datos (PDF) - STMicroelectronics

Número de pieza

componentes Descripción

Fabricante

STV7620

PLASMA DISPLAY PANEL SCAN DRIVER

STMicroelectronics 

Figure 3. Zoom for OUTn showing tS and tF OUT

tF OUT

OUTn

90%

STV7620S/M/F

Figure 4. Test configuration

VPP=VSSP

VDOUTH

tS

IDOUTH

10%

VPP=VSSP

VSSP

VSSP

VDOUTL

Output sinking current as positive value, sourcing current as negative value

IDOUTL

11 TESTED WAFER DISCLAIMER

All wafers are tested and guaranteed to comply with all datasheet limits up to the point of wafer sawing for

a period of ninety (90) days from the delivery date.

We remind you that it is the customer’s responsibility to test and qualify their application in which the die

is used. ST Microelectronics is ready to support the customer when qualifying the product.

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