SST25PF020B(2012) Ver la hoja de datos (PDF) - Microchip Technology
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SST25PF020B Datasheet PDF : 33 Pages
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SST25PF020B
TABLE 5-4:
Parameter
COUT1
CIN1
CAPACITANCE (TA = 25°C, F=1 MHZ, OTHER PINS OPEN)
Description
Output Pin Capacitance
Input Capacitance
Test Condition
VOUT = 0V
VIN = 0V
Maximum
12 pF
6 pF
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
TABLE 5-5:
Symbol
NEND1
TDR1
ILTH1
RELIABILITY CHARACTERISTICS
Parameter
Minimum Specification
Endurance
10,000
Data Retention
100
Latch Up
100 + IDD
Units
Cycles
Years
mA
Test Method
JEDEC Standard A117
JEDEC Standard A103
JEDEC Standard 78
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
TABLE 5-6: AC OPERATING CHARACTERISTICS, 2.3-2.7V
25 MHz
Symbol
Parameter
Min
FCLK1
Serial Clock Frequency
TSCKH
Serial Clock High Time
18
TSCKL
Serial Clock Low Time
18
TSCKR
Serial Clock Rise Time (Slew Rate)
0.1
TSCKF
TCES2
TCEH2
TCHS2
TCHH2
Serial Clock Fall Time (Slew Rate)
0.1
CE# Active Setup Time
5
CE# Active Hold Time
5
CE# Not Active Setup Time
5
CE# Not Active Hold Time
5
TCPH
CE# High Time
50
TCHZ
CE# High to High-Z Output
TCLZ
SCK Low to Low-Z Output
0
TDS
Data In Setup Time
2
TDH
Data In Hold Time
4
THLS
HOLD# Low Setup Time
5
THHS
HOLD# High Setup Time
5
THLH
HOLD# Low Hold Time
5
THHH
HOLD# High Hold Time
5
THZ
HOLD# Low to High-Z Output
TLZ
HOLD# High to Low-Z Output
TOH
Output Hold from SCK Change
0
TV
Output Valid from SCK
TSE
Sector-Erase
TBE
Block-Erase
TSCE
Chip-Erase
TBP
Byte-Program
Max
25
7
7
7
12
25
25
50
10
1. Maximum clock frequency for Read instruction, 03H, is 25 MHz
2. Relative to SCK
50 MHz
Min
Max
50
9
9
0.1
0.1
5
5
5
5
50
7
0
2
4
5
5
5
5
7
7
0
8
25
25
50
10
Units
MHz
ns
ns
V/ns
V/ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
ms
ms
µs
2012 Microchip Technology Inc.
DS25135A-page 21
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