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SP3221 Ver la hoja de datos (PDF) - Signal Processing Technologies

Número de pieza
componentes Descripción
Fabricante
SP3221
Sipex
Signal Processing Technologies Sipex
SP3221 Datasheet PDF : 18 Pages
First Prev 11 12 13 14 15 16 17 18
RRCC
DC Power
Source
SW1
Contact-Discharge Module
RRSS
RV
SW2
CSS
Device
Under
Test
Figure 18. ESD Test Circuit for IEC1000-4-2
The circuit model in Figures 17 and 18 represent
the typical ESD testing circuit used for all three
methods. The CS is initially charged with the DC
power supply when the first switch (SW1) is on.
Now that the capacitor is charged, the second
switch (SW2) is on while SW1 switches off. The
voltage stored in the capacitor is then applied
through RS, the current limiting resistor, onto the
device under test (DUT). In ESD tests, the SW2
switch is pulsed so that the device under test
receives a duration of voltage.
For the Human Body Model, the current limiting
resistor (RS) and the source capacitor (CS) are
1.5kan 100pF, respectively. For IEC-1000-4-
2, the current limiting resistor (RS) and the source
capacitor (CS) are 330an 150pF, respectively.
The higher CS value and lower RS value in the
IEC1000-4-2 model are more stringent than the
Human Body Model. The larger storage capacitor
injects a higher voltage to the test point when
SW2 is switched on. The lower current limiting
resistor increases the current charge onto the test
point.
RS and RV add up to 330for IEC1000-4-2.
30A
15A
0A
t=0ns
t=30ns
t
Figure 19. ESD Test Waveform for IEC1000-4-2
DEVICE PIN
TESTED
HUMAN BODY
IEC1000-4-2
MODEL
Air Discharge Direct Contact
Driver Outputs
Receiver Inputs
±15kV
±15kV
±15kV
±15kV
±8kV
±8kV
Table 4. Transceiver ESD Tolerance Levels
Level
4
4
Date: 7/21/04
SP3221E +3.0V to +5.5V RS-232 Transceiver
15
© Copyright 2004 Sipex Corporation

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