MX29F001BQC-90 Ver la hoja de datos (PDF) - Macronix International

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componentes Descripción

Fabricante

MX29F001BQC-90

1M-BIT [128K x 8] CMOS FLASH MEMORY

Macronix International 

SWITCHING TEST CIRCUITS

DEVICE UNDER

TEST

MX29F001T/B

1.6K ohm

+5V

CL

1.2K ohm

DIODES=IN3064

OR EQUIVALENT

CL=100pF Including jig capacitance for 29F001T/B-70, 29F001T/B-90, 29F001T/B-12

30pF Including jig capacitance for 29F001T/B-55

SWITCHING TEST WAVEFORMS(I) for 29F001T/B-70, 29F001T/B-90, 29F001T/B-12

2.4 V

0.45 V

2.0V

INPUT

0.8V

TEST POINTS

2.0V

0.8V

OUTPUT

AC TESTING: Inputs are driven at 2.4V for a logic "1" and 0.45V for a logic "0".

Input pulse rise and fall times are < 10ns.

SWITCHING TEST WAVEFORMS(II) for 29F001T/B-55

3.0 V

1.5V

TEST POINTS 1.5V

0V

INPUT

OUTPUT

AC TESTING: Inputs are driven at 3.0V for a logic "1" and 0V for a logic "0".

Input pulse rise and fall times are < 5ns.

P/N: PM0515

REV. 2.1, JUN. 14, 2001

18

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