HI1176 Ver la hoja de datos (PDF) - Intersil
Número de pieza
componentes Descripción
Fabricante
HI1176 Datasheet PDF : 12 Pages
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Test Circuits
HI1176
2.6V
fC -1kHz
SG
0.6V
1
AMP
2
VIN DUT
HI1176
NTSC
SIGNAL
40 IRE
SOURCE 100 MODULATION
2.6V
IRE
0
-40
BURST
SYNC
0.6V
SG
(CW) fC
8 TTL
ECL
TTL
ECL
HI20201
1
8
10-BIT
D/A
2
CLK
620
-5.2V
620
-5.2V
ERROR RATE
HPF
COUNTER
VECTOR
SCOPE
DG
DP
FIGURE 9. MAXIMUM OPERATIONAL SPEED AND DIFFERENTIAL GAIN AND PHASE ERROR TEST CIRCUIT
2.6V
0.6V
VDD
VRT
VIN
VRB
CLK
OE
GND
IOL
VOL
+
-
2.6V
0.6V
VDD
VRT
VIN
VRB
CLK
OE
GND
IOH
VOH
+
-
FIGURE 10. DIGITAL OUTPUT CURRENT TEST CIRCUIT
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Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
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