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MLX90255-BC

Linear Optical Array

Melexis Microelectronic Systems  

MLX90255-BC

Linear Optical Array

MLX90255BC Electrical specifications

All tests are made with 0.7ms integration time at 25°C at 880nm and with a clock speed of 500kHz in,

250kHz out, and 500kHz, unless otherwise specified in the Test Conditions. 100% light under Test

Conditions means that the light is set in such a way that there is 2.4V at the output of the chip.

Parameter

Symbol Test Conditions

Min Typ Max

Units

Sensitivity for devices with glas lid Sensitivity At 25°C

Sensitvity for open devices

Polyimide Wafer

Illumination (1)

Illum100 At 25°C, 2.4V at output

Average analog output (1)

VaoLight At 25°C, 100% light

Average analog output

Initial offset At 25°C, 0% light

Average analog output

VaoDark At 125°C, 0% light

Highest Dark Pixel

Vaodarkmax At 125°C, 0.25ms integration time

Non Linearity

Nlao1 All Temp

Pixel Response Non Uniformity (2) PRNU All Temp, 100% light

Pixel Interaction Test (3)

PIT AT 25°C

Noise Level (4)

Vn All Temp

Hold spec, same as PRNU

PRNUH All Temp, 100% light, 62.5kHz

Output Settling Time

Ts All Temp

Array Lag (5)

Alag At 25°C

Dark Signal Non Uniformity (6)

Analog Output Saturation

DSNU

At 25°C

At 125°C

All Temp

Change in sensitivity with

Temperature at 880nm (7)

Operating Free Temp

Supply Current (8)

Idd

0.135

0.14

0.14

0

0

3.0

-40

2

0.151

0.16

0.176

14

0.179

0.19

0.21

2.4

0.15 0.3

0.40 1.4

0.8

±0.5% ±1.2%

±4.0% ±8.5%

5%

3

6

±4.0% ±8.5%

450 750

0.5%

80 120

140 440

0.3

125

5

8

V/µW/

cm2

µW/cm²

V

V

V

V

FS

FS

FS

mV (RMS)

FS

ns

FS

mV

mV

V

%/°C

°C

mA

(0) After power on, the first integration scan is not guaranteed correct. This scan is needed for initializing digital levels on chip. After a SI and 133 proper

CLK signals, the system is fully initialized and all further scans are valid. The next SI will provide a valid scan.

(1) Absolute Light measurements are very test-setup dependent and should be regarded with caution. Relative measurements are possible with ±1%

accuracy.

(2) PRNU is defined as the worst case deviation of any PixelValue (pixel 3 till 130) to the average light value. PixelValue = (Vout of a pixel at 100% light

– Vout of same pixel at 0% light) The MLX90255BC has a cosine shaped gain: external pixels have 15% more gain than middle pixels.

(3) PIT = (Vout of pixel 132 @ 10µW – Vout of pixel 132 @0µW) / (Vaverage @10µW – Vaverage @10µW)

(4) Noise: We compare 5 different measurements, normalize them and then take the RMS value.

(5) Array Lag is defined as: (Vaverage 0µW1 Vaverage 0µW2) / ((Vaverage 10µW Vaverage 0µW2). Where 0µW1 is a 0% light level, 1ms after a 100%

light level. (there can still be some light effects). 0µW2 is a 0% light level, 10ms after a 100% light level, which should be a true dark reference.

(6) DSNU is defined as: (max Vout of pixel I @ 0% light) - (min Vout of pixel j @ 0% light) for pixels 3 thru 130

(7) Sensitivity always increases with rising temperature.

(8) Idd is measured with Rload disconnected from the output pin.

390109025503

Rev. 001

Page 4 of 12

Nov/05

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