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MBRB3030CTLG Ver la hoja de datos (PDF) - ON Semiconductor

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componentes Descripción
Fabricante
MBRB3030CTLG
ON-Semiconductor
ON Semiconductor ON-Semiconductor
MBRB3030CTLG Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
MBRB3030CTL
Suggested Method of Characterization
INDUCTOR
CURRENT
DUT
REVERSE
VOLTAGE
TIME (s)
Figure 11. Typical Voltage and Current UIS
Waveforms
Utilizing the UIS test circuit in Figure 10, devices are
tested to failure using inductors ranging in value from 0.01
to 159 mH. The reverse voltage and current waveforms are
acquired to determine the exact energy seen by the device
and the inductive current decay time. At least 4 distinct
inductors and 5 to 10 devices per inductor are used to
generate the characteristic current versus time relationship.
This relationship when coupled with the application circuit
conditions, defines the SOA of the device uniquely for this
application.
Example Application
The device used for this example was an MBR3035CT,
which is a 30 A (15 A per side) forward current, 35 V reverse
breakdown voltage rectifier. All parts were tested to
destruction at 25°C. The inductors used for the
characterization were 10, 3.0, 1.0 and 0.3 mH. The data
recorded from the testing were peak reverse current (Ip),
peak reverse breakdown voltage (BVR), maximum
withstand energy, inductance and inductor discharge time
(see Table 1). A plot of the Peak Reverse Current versus
Time at device destruction, as shown in Figure 12, was
generated. The area under the curve is the region of lower
reverse energy or lower stress on the device. This area is
known as the safe operating area or SOA.
120
100
80
60
UIS CHARACTERIZATION CURVE
40
20
SAFE OPERATING AREA
0
0 0.0005 0.001 0.0015 0.002 0.0025 0.003 0.0035 0.004
TIME (s)
Figure 12. Peak Reverse Current versus
Time for DUT
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