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M59DR032EB Ver la hoja de datos (PDF) - STMicroelectronics

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M59DR032EB Datasheet PDF : 43 Pages
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M59DR032EA, M59DR032EB
Table 17. Read AC Characteristics
M59DR032E
Symbol Alt
Parameter
Test Condition
85
100
120
Unit
Min Max Min Max Min Max
tAVAV
tRC
Address Valid to Next
Address Valid
E = VIL, G = VIL 85
100
120
ns
tAVQV
tACC
Address Valid to Output
Valid (Random)
E = VIL, G = VIL
85
100
120 ns
tAVQV1
tPAGE
Address Valid to Output
Valid (Page)
E = VIL, G = VIL
30
35
45 ns
tELQX (1)
tLZ
Chip Enable Low to
Output Transition
G = VIL
0
0
0
ns
tELQV (2)
tCE
Chip Enable Low to
Output Valid
G = VIL
85
100
120 ns
tGLQX (1)
tOLZ
Output Enable Low to
Output Transition
E = VIL
0
0
0
ns
tGLQV (2)
tOE
Output Enable Low to
Output Valid
E = VIL
25
25
35 ns
tEHQX
tOH
Chip Enable High to
Output Transition
G = VIL
0
0
0
ns
tEHQZ (1)
tHZ
Chip Enable High to
Output Hi-Z
G = VIL
20
25
35 ns
tGHQX
tOH
Output Enable High to
Output Transition
E = VIL
0
0
0
ns
tGHQZ (1)
tDF
Output Enable High to
Output Hi-Z
E = VIL
20
25
35 ns
tAXQX
tOH
Address Transition to
Output Transition
E = VIL, G = VIL
0
0
0
ns
Note: 1. Sampled only, not 100% tested.
2. G may be delayed by up to tELQV - tGLQV after the falling edge of E without increasing tELQV.
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