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M29W160EB Ver la hoja de datos (PDF) - STMicroelectronics

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M29W160EB Datasheet PDF : 40 Pages
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Figure 7. Data Polling Flowchart
START
READ DQ5 & DQ7
at VALID ADDRESS
DQ7
=
YES
DATA
NO
NO DQ5
=1
YES
READ DQ7
at VALID ADDRESS
DQ7
=
YES
DATA
NO
FAIL
PASS
AI03598
M29W160ET, M29W160EB
Figure 8. Data Toggle Flowchart
START
READ DQ6
READ
DQ5 & DQ6
DQ= 6
NO
TOGGLE
YES
NO DQ5
=1
YES
READ DQ6
TWICE
DQ= 6
NO
TOGGLE
YES
FAIL
PASS
AI01370C
MAXIMUM RATING
Stressing the device above the rating listed in the
Absolute Maximum Ratings" table may cause per-
manent damage to the device. Exposure to Abso-
lute Maximum Rating conditions for extended
periods may affect device reliability. These are
stress ratings only and operation of the device at
these or any other conditions above those indicat-
ed in the Operating sections of this specification is
not implied. Refer also to the STMicroelectronics
SURE Program and other relevant quality docu-
ments.
Table 8. Absolute Maximum Ratings
Symbol
Parameter
Min
Max
TBIAS
Temperature Under Bias
–50
125
TSTG
Storage Temperature
–65
150
VIO
Input or Output Voltage (1,2)
–0.6
VCC +0.6
VCC
Supply Voltage
–0.6
4
VID
Identification Voltage
–0.6
13.5
Note: 1. Minimum voltage may undershoot to –2V during transition and for less than 20ns during transitions.
2. Maximum voltage may overshoot to VCC +2V during transition and for less than 20ns during transitions.
Unit
°C
°C
V
V
V
19/40

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