AS1110-BSST Ver la hoja de datos (PDF) - austriamicrosystems AG
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AS1110-BSST Datasheet PDF : 24 Pages
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AS1110
Datasheet - Application Information
The last pattern written into the shift register will be saved before starting low-current diagnosis mode and can be dis-
played immediately after the test has been performed.
Low-current diagnostic mode is started with 3 clock pulses during error detection mode. Then OEN should be enabled
for ≥2µs for testing. With the rising edge of OEN the LED test is stopped, and while LD is high the desired error mode
can be selected with the corresponding clock pulses. After LD and OEN go low again the previously saved pattern can
be displayed at the outputs.
With the next data input the detailed error code will be clocked out at pin SDO.
Note: See Figure 21 for use of an external test pattern.
Figure 21. Low-Current Diagnosis Mode with External Test Pattern – 64 Cascaded AS1110s
Display
Data1
Low-Current Diagnosis Mode
Data2
SDI
External all 1s Test Pattern
Data2
Data3
SDO
CLK
OEN
LD
Current
T/O or S Error Code
Data0
1024x
3x Clocks
Low-Current
Mode
GEF
Clock for Error
Mode 1x/2x
O or S Error Code
from Test Pattern
1024x
GEF
Rising Edge of OEN
Acquisition of Error Status
Falling Edge of LD; Error Register
is copied into Shift Register
Temperature Error Code
1024x
≤ 100mA
≤ 0.8mA
≤ 100mA
GEF = Global Error Flag
Cascading Devices
To cascade multiple AS1110 devices, pin SDO must be connected to pin SDI of the next AS1110 (see Figure 22). At
each rising edge of CLK the LSB of the shift register will be written into the shift register SDI of the next AS1110 in the
chain.
Note: When n*AS1110 devices are in one chain, n*16 clock pulses are needed to latch-in the input data.
Figure 22. Cascading AS1110 Devices
SDI
SDI AS1110 #1 SDO SDI AS1110 #2 SDO
CLK
LD
OEN
CLK LD
OEN
CLK LD
OEN
SDI AS1110 #n-1 SDO
CLK LD
OEN
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