29F040 Ver la hoja de datos (PDF) - Advanced Micro Devices

Número de pieza

componentes Descripción

Fabricante

29F040

4 Megabit (512 K x 8-Bit) CMOS 5.0 Volt-only, Uniform Sector Flash Memory

Advanced Micro Devices 

PRELIMINARY

TEST CONDITIONS

5.0 V

Device

Under

Test

CL

6.2 kΩ

2.7 kΩ

Note: Diodes are IN3064 or equivalent

Figure 7. Test Setup

21445B-12

Table 6. Test Specifications

Test Condition

-55 All others Unit

Output Load

1 TTL gate

Output Load Capacitance, CL

(including jig capacitance)

30

100

pF

Input Rise and Fall Times

5

20

ns

Input Pulse Levels

0.0–3.0 0.45–2.4 V

Input timing measurement

reference levels

1.5

0.8

V

Output timing measurement

reference levels

1.5

2.0

V

KEY TO SWITCHING WAVEFORMS

WAVEFORM

INPUTS

Steady

OUTPUTS

Changing from H to L

Changing from L to H

Don’t Care, Any Change Permitted

Changing, State Unknown

Does Not Apply

Center Line is High Impedance State (High Z)

KS000010-PAL

Am29F040B

19

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