ADIS16266 Ver la hoja de datos (PDF) - Analog Devices
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ADIS16266 Datasheet PDF : 24 Pages
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Data Sheet
Memory Management
The FLASH_CNT register (see Table 27) tracks the number of
write cycles for the flash memory to help manage the total
cycles against the endurance ratings in Table 1.
Table 27. FLASH_CNT Bits (Base Address = 0x00)
Bits
Description
[15:0]
Flash update counter
DIAGNOSTICS
Self-Test
The self-test function allows the user to verify the mechanical
integrity of each MEMS sensor. It applies an electrostatic force
to each sensor element, which results in mechanical displacement
that simulates a response to actual motion. Table 1 lists the
expected response for the sensor, which provides pass/fail
criteria.
Set MSC_CTRL[10] = 1 (DIN = 0xB504) to run the internal
self-test routine, which exercises the inertial sensor, measures
the response, makes a pass/fail decision, reports the decision to
the error flags in the DIAG_STAT register, and then restores
normal operation. MSC_CTRL[10] resets itself to 0 after
completing the routine. The MSC_CTRL[9:8] bits provide
manual control of the self-test function for investigation of
potential failures. Table 28 outlines an example test flow for
using this option to verify the gyroscope function.
Table 28. Manual Self-Test Example Sequence
DIN
Description
0xB601
SMPL_PRD[7:0] = 0x01, sample rate = 2429 SPS.
0xB904
SENS_AVG[15:8] = 0x04, range = ±14000°/sec.
0xB802
SENS_AVG[7:0] = 0x02, four-tap averaging filter.
Delay = 50 ms.
0x0400
Read GYRO_OUT.
0xB502
MSC_CTRL[9:8] = 10, gyroscope negative self-test.
Delay = 50 ms.
0x0400
Read GYRO_OUT.
Determines whether the bias in the gyroscope
output changed according to the self-test
response specified in Table 1.
0xB501
MSC_CTRL[9:8] = 01, gyroscope positive self-test.
Delay = 50 ms.
0x0400
Read GYRO_OUT.
Determines whether the bias in the gyroscope
output changed according to the self-test
response specified in Table 1.
0xB500
MSC_CTRL[15:8] = 0x00.
ADIS16266
Zero motion provides results that are more reliable. The settings in
Table 28 are flexible and allow for optimization around speed and
noise influence. For example, using fewer filtering taps decreases
delay times but increases the potential for noise influence.
Memory Test
Setting MSC_CTRL[11] = 1 (DIN = 0xB508) performs a check-
sum comparison between the flash memory and SRAM to help
verify memory integrity. The pass/fail result is loaded into the
DIAG_STAT[6] register.
Status
The error flags provide indicator functions for common system
level issues. All of the flags are cleared (set to 0) after each
DIAG_STAT register read cycle. If an error condition remains,
the error flag returns to 1 during the next sample cycle.
DIAG_STAT[1:0] does not require a read of this register to
return to 0. When the power supply voltage goes back into
range, these two flags clear automatically.
Table 29. DIAG_STAT Bits (Base Address = 0x3C)
Bits
Description
[15:10] Not used.
9
Alarm 2 status (1 = active, 0 = inactive).
8
Alarm 1 status (1 = active, 0 = inactive).
7
Not used.
6
Flash test, checksum flag (1 = fail, 0 = pass).
5
Self-test diagnostic error flag (1 = fail, 0 = pass).
4
Sensor overrange (1 = fail, 0 = pass).
3
SPI communication failure (1 = fail, 0 = pass).
2
Flash update failure (1 = fail, 0 = pass).
1
Power supply > 5.25 V.
1 = power supply > 5.25 V, 0 = power supply ≤ 5.25 V.
0
Power supply < 4.75 V.
1 = power supply < 4.75 V, 0 = power supply ≥ 4.75 V.
Rev. A | Page 17 of 24
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