TEST CIRCUITS
Figure 24 to Figure 29 illustrate the test circuits that define the
test conditions used in the product specification tables.
DUT
A
W
V+
B
V+ = VDD
1LSB = V+/2N
VMS
Figure 24. Test Circuit for Potentiometer Divider Nonlinearity Error (INL, DNL)
NO CONNECT
DUT
AW
B
IW
VMS
Figure 25. Test Circuit for Resistor Position Nonlinearity Error
(Rheostat Operation; R-INL, R-DNL)
VMS2
DUT
A
W
B
IW = VDD/RNOMINAL
VW
RW = [VMS1 – VMS2]/IW
VMS1
Figure 26. Test Circuit for Wiper Resistance
AD5170
VA
DUT
V+ ∆VDD A W
B
V+ = VDD ± 10%
( ) PSRR (dB) = 20 LOG
PSS
(%/%)
=
∆VMS%
∆VDD%
∆VMS
∆VDD
VMS
Figure 27. Test Circuit for Power Supply Sensitivity (PSS, PSSR)
VIN
OFFSET
GND
2.5V
DUT
AW
B
+15V
AD8610
–15V
VOUT
Figure 28. Test Circuit for Gain vs. Frequency
NC
DUT
VDD
A
ICM
W
GND B
VCM
NC NC = NO CONNECT
Figure 29. Test Circuit for Common-Mode Leakage Current
Rev. A | Page 11 of 24