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74F14

Hex inverter Schmitt trigger

Philips Electronics 

Philips Semiconductors

Hex inverter Schmitt trigger

Product specification

74F14

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST CONDITIONS1

LIMITS

MIN TYP2 MAX

UNIT

VT+

Positive-going threshold

VCC = 5.0V

1.4

1.7

2.0

V

VT–

Negative-going threshold

VCC = 5.0V

0.7

0.9

1.1

V

∆VT

Hysteresis (VT+ – VT–)

VCC = 5.0V

0.4

0.8

V

VOH

High-level output voltage

VCC = MIN, VI = VT–MIN, ±10%VCC

2.5

V

IOH = MAX

±5%VCC

2.7

3.4

V

VOL

Low-level output voltage

VCC = MIN, VI = VT+MAX, ±10%VCC

0.30 0.50

V

IOL = MAX

±5%VCC

0.30 0.50

V

VIK

Input clamp voltage

VCC = MIN, II = IIK

-0.73 -1.2

V

IT+

Input current at positive-going threshold VCC = 5.0V, VI = VT+

0

µA

IT–

Input current at negative-going threshold VCC = 5.0V, VI = VT–

–175

µA

II

Input current at maximum input voltage VCC = MAX, VI = 7.0V

100

µA

IIH

High-level input current

VCC = MAX, VI = 2.7V

20

µA

IIL

Low-level input current

IOS

Short-circuit output current3

VCC = MAX, VI = 0.5V

VCC = MAX

-0.6

mA

-60

-150

mA

ICC

Supply current (total)

ICCH VCC = MAX

VIN = GND

13

22

mA

ICCL VCC = MAX

VIN = 4.5V

23

32

mA

NOTES:

1 For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

2 All typical values are at VCC = 5V, Tamb = 25°C.

3 Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

AC ELECTRICAL CHARACTERISTICS

SYMBOL

tPLH

tPHL

PARAMETER

Propagation delay

Dn to Qn

TEST

CONDITION

Waveform 1

VCC = +5.0V

Tamb = +25°C

CL = 50pF, RL = 500Ω

MIN TYP MAX

4.0

6.5

8.5

3.5

5.0

6.5

LIMITS

VCC = +5.0V ± 10%

Tamb = 0°C to +70°C

CL = 50pF, RL = 500Ω

MIN

MAX

4.0

9.5

3.5

7.0

VCC = +5.0V ± 10%

Tamb = –40°C to +85°C

CL = 50pF, RL = 500Ω

MIN

MAX

3.0

10.5

3.5

9.0

UNIT

ns

November 26, 1990

4

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