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MAX5940A(2003) Ver la hoja de datos (PDF) - Maxim Integrated

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MAX5940A Datasheet PDF : 15 Pages
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IEEE 802.3af PD Interface Controller
For Power-Over-Ethernet
Inrush Current Limit
The MAX5940A/MAX5940B charge the gate of the
internal MOSFET with a constant current source (10µA,
typ). The drain-to-gate capacitance of the MOSFET lim-
its the voltage rise rate at the drain, thereby limiting the
inrush current. Add an external capacitor from GATE to
OUT to further reduce the inrush current. Use the fol-
lowing equation to calculate the inrush current:
IINRUSH
=
IG
x
COUT
CGATE
PGOOD/PGOOD Outputs
(MAX5940A/MAX5940B)
PGOOD is an open-drain, active-high logic output.
PGOOD goes high impedance when VOUT is within 1.2V
of VEE and when GATE is 5V above VEE. Otherwise,
PGOOD is pulled to VOUT (given that VOUT is at least 5V
below GND). Connect PGOOD to the ON pin of a down-
stream DC-DC converter. Connect a 100kpullup resis-
tor from PGOOD to GND if needed.
(MAX5940B only)
PGOOD is an open-drain, active-low logic output.
PGOOD is pulled to VEE when VOUT is within 1.2V of VEE
and when GATE is 5V above VEE. Otherwise, PGOOD
goes high impedance. Connect PGOOD to the ON pin of
a downstream DC-DC converter. Connect a 100k
pullup resistor from PGOOD to GND if needed.
Thermal Dissipation
During classification mode, if the PSE applies the maxi-
mum DC voltage, the maximum voltage drop from GND
to VRCLASS will be 13V. If the maximum classification
current of 42mA flows through the MAX5940A/
MAX5940B, then the maximum DC power dissipation will
be 546mW, which is slightly higher than the maximum
DC power dissipation of the IC at maximum operating
temperature. However, according to the IEEE 802.3af
standard, the duration of the classification mode is limit-
ed to 75ms (max). The MAX5940A/MAX5940B handle
the maximum classification power dissipation for the
maximum duration time without sustaining any internal
damage. If the PSE violates the IEEE 802.3af standard
by exceeding the 75ms maximum classification duration,
it may cause internal damage to the IC.
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