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SCAN182245A Ver la hoja de datos (PDF) - Fairchild Semiconductor

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componentes Descripción
Fabricante
SCAN182245A Datasheet PDF : 13 Pages
First Prev 11 12 13
AC Operating Requirements
Scan Test Operation
VCC
TA = −40°C to +85°C
Symbol
Parameter
(V)
CL = 50 pF
(Note 7)
Guaranteed Minimum
tS
Setup Time
Data to TCK (Note 8)
5.0
4.8
tH
Hold Time
Data to TCK (Note 8)
5.0
2.5
tS
Setup Time, H or L
G1, G2 to TCK (Note 9)
5.0
4.1
tH
Hold Time, H or L
TCK to G1, G2 (Note 9)
5.0
1.7
tS
Setup Time, H or L
DIR1, DIR2 to TCK (Note 10)
5.0
4.2
tH
Hold Time, H or L
TCK to DIR1, DIR2 (Note 10)
5.0
2.3
tS
Setup Time
Internal OE to TCK (Note 11)
5.0
3.8
tH
Hold Time, H or L
TCK to Internal OE (Note 10)
5.0
2.3
tS
Setup Time, H or L
TMS to TCK
5.0
8.7
tH
Hold Time, H or L
TCK to TMS
5.0
1.5
tS
Setup Time, H or L
TDI to TCK
5.0
6.7
tH
Hold Time, H or L
TCK to TDI
5.0
5.0
tW
Pulse Width TCK:
H
10.2
5.0
L
8.5
fMAX
Maximum TCK
Clock Frequency
5.0
50
tPU
Wait Time,
Power Up to TCK
5.0
100
tDN
Power Down Delay
Note 7: Voltage Range 5.0V ± 0.5V
0.0
100
Note 8: Timing pertains to the TYPE1 BSR and TYPE2 BSR after the buffer (BSR 08, 917, 1826, 2735, 3644, 4553, 5462, 6371).
Note 9: Timing pertains to BSR 74 and 78 only.
Note 10: Timing pertains to BSR 75 and 79 only.
Note 11: Timing pertains to BSR 72, 73, 76 and 77 only.
Note: All Input Timing Delays involving TCK are measured from the rising edge of TCK.
Units
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
MHz
ns
ms
Capacitance
Symbol
Parameter
Typ
CIN
Input Capacitance
5.9
CI/O (Note 12) Output Capacitance
13.7
Note 12: CI/O is measured at frequency f = 1 MHz, per MIL-STD-883B, Method 3012.
Units
pF
pF
Conditions, TA = 25°C
VCC = 0.0V (Gn, DIRn)
VCC = 5.0V (An, Bn)
11
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